The
Max-Planck-Institute for Chemistry runs a modified
Cameca IMS3f ion microprobe.
On this page you find a technical description of this instrument.
General : |
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Ion optics layout |
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View of the instrument |
Features :
- O-, O2+, or
Cs+ primary ion beam
- Secondary ion mass range from H to U
- Mass resolution power M/
DM up to 8000
- SEM secondary ion counting system, or Faraday Cup
ion current measurement
- Microchannel plate / Fluorescent screen detector
for use as a secondary ion microscope
Specials :
- CCD camera mounted for secondary
ion imaging
- Improved peripheral electronics for better
voltage stability
- Customized software for isotopic analyses,
written in LabVIEW
- Automated ion imaging mode fully integrated to
control software
- Customized software for
rare-earth-element
analyses
Related links :
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© Copyright 2002 Max-Planck-Institut für
Chemie, Abteilung Kosmochemie |
